We are pleased to announce the release of our SCOUT 150 probes, completing our SCOUT series of silicon AFM probes for general imaging applications in AC modes (non-contact/tapping) in air.
With a nominal spring constant of 18 N/m and a resonant frequency of 150 kHz, SCOUT 150 fills the gap in mechanical properties between our existing SCOUT 70 (2 N/m) and SCOUT 350 (42 N/m) probes. This range of spring constants facilitates reliable imaging on samples ranging from the soft(ish) through to the very hard.
SCOUT 150 probes, like others in the SCOUT range, are available with or without aluminium or gold reflective coatings (SCOUT 150 RAl and SCOUT 150 RAu). They are also available with a high aspect ratio (SCOUT 150 HAR) tip for deep trench imaging.
James Vicary, Managing Director at NuNano comments “I know just how critical it is to use exactly the right probe to get the best possible image – to be able to broaden our product range and offer our customers more choice is what the business is all about for me.”
About SCOUT 150 AFM Probe Model
The SCOUT 150 model of AFM probes have been specifically developed to provide the same exemplary dimensional tolerances and tip sharpness characteristic of all our AFM probes. Click on the links below for more detailed specifications and pricing:
SCOUT 150 - general purpose AC mode silicon AFM probes, suitable for non-contact/soft tapping modes in air. Spring constant: 18 N/m. Resonant frequency: 150 kHz
SCOUT 150 HAR – as above but featuring a high aspect ratio tip with a cone angle over the last 1 μm of less than 15 degrees.
As with all NuNano products the SCOUT 150 model is compatible with most commercially available AFMs.
For more information, to request a datasheet, free sample or a meeting with one of our team to discuss your needs further please call - +44 117 299 3093 or email info@nunano.com
